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%0 Journal Article
%1 journals/mr/MavinkurveMSZ16
%A Mavinkurve, A.
%A Martinez, J. L. M. Llacer
%A van Soestbergen, M.
%A Zaal, Jeroen J. M.
%D 2016
%J Microelectronics Reliability
%K dblp
%P 254-258
%T Moisture absorption by molding compounds under extreme conditions: Impact on accelerated reliability tests.
%U http://dblp.uni-trier.de/db/journals/mr/mr64.html#MavinkurveMSZ16
%V 64
@article{journals/mr/MavinkurveMSZ16,
added-at = {2017-01-27T00:00:00.000+0100},
author = {Mavinkurve, A. and Martinez, J. L. M. Llacer and van Soestbergen, M. and Zaal, Jeroen J. M.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2978ae540abfe56ec06c959084af599e2/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2016.07.105},
interhash = {cc935692c8c2571aef7d819d730185ac},
intrahash = {978ae540abfe56ec06c959084af599e2},
journal = {Microelectronics Reliability},
keywords = {dblp},
pages = {254-258},
timestamp = {2017-01-28T10:32:37.000+0100},
title = {Moisture absorption by molding compounds under extreme conditions: Impact on accelerated reliability tests.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#MavinkurveMSZ16},
volume = 64,
year = 2016
}
