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%0 Conference Paper
%1 conf/essderc/HeukenAOABWR18
%A Heuken, Lars
%A Alshahed, Muhammad
%A Ottaviani, Alessandro
%A Alomari, Mohammed
%A Burghartz, Joachim N.
%A Waizmann, Ulrike
%A Reindl, Thomas
%B ESSDERC
%D 2018
%I IEEE
%K dblp
%P 22-25
%T Localization and analysis of surface charges trapped in AlGaN/GaN HEMTs using multiple secondary MIS gates.
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2018.html#HeukenAOABWR18
%@ 978-1-5386-5401-9
@inproceedings{conf/essderc/HeukenAOABWR18,
added-at = {2019-04-30T00:00:00.000+0200},
author = {Heuken, Lars and Alshahed, Muhammad and Ottaviani, Alessandro and Alomari, Mohammed and Burghartz, Joachim N. and Waizmann, Ulrike and Reindl, Thomas},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a35f9b446c18656543487d01091909af/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2018},
ee = {https://doi.org/10.1109/ESSDERC.2018.8486910},
interhash = {ca8272ca66f5bcd3c63c5d181fd48fa1},
intrahash = {a35f9b446c18656543487d01091909af},
isbn = {978-1-5386-5401-9},
keywords = {dblp},
pages = {22-25},
publisher = {IEEE},
timestamp = {2019-09-27T12:42:05.000+0200},
title = {Localization and analysis of surface charges trapped in AlGaN/GaN HEMTs using multiple secondary MIS gates.},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2018.html#HeukenAOABWR18},
year = 2018
}
