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%0 Journal Article
%1 Kragl_ECCE2025
%A Kragl, R.
%A Oberdieck, K.
%A Spanos, K.
%A Beushausen, S.
%A Kallfass, I.
%D 2025
%J in Proc. IEEE Energy Conversion Conference and Expo (ECCE 2025)
%K imported
%T Active Voltage Probe for Direct Measurement of Emitted Noise of Power Semiconductors
@article{Kragl_ECCE2025,
added-at = {2025-05-26T10:46:09.000+0200},
author = {Kragl, R. and Oberdieck, K. and Spanos, K. and Beushausen, S. and Kallfass, I.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d27eabb005677d280bba78f99285178e/ingmarkallfass},
date-added = {2024-06-19 23:21:10 +0200},
date-modified = {2025-05-25 19:41:01 +0200},
interhash = {c29d1eb35d04a72b101dae8b6ad03e06},
intrahash = {d27eabb005677d280bba78f99285178e},
journal = {in Proc. IEEE Energy Conversion Conference and Expo (ECCE 2025)},
keywords = {imported},
timestamp = {2025-05-26T10:46:09.000+0200},
title = {Active Voltage Probe for Direct Measurement of Emitted Noise of Power Semiconductors},
year = 2025
}