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%0 Journal Article
%1 joachimn-iopdaepeidspebt1992
%A Burghartz, Joachim N.
%A Sun, Jack Yuan-Chen
%A Stanis, Carol L.
%A Mader, Siegfried R.
%A Warnock, James D.
%C Piscataway, New Jersey
%D 1992
%I IEEE
%J IEEE Transactions on Electron Devices
%K INES
%N 6
%P 1477-1489
%R 10.1109/16.137329
%T Identification of perimeter depletion and emitter plug effects in deep-submicrometer, shallow-junction polysilicon emitter bipolar transistors
%V 39
@article{joachimn-iopdaepeidspebt1992,
added-at = {2019-04-11T18:02:57.000+0200},
address = {Piscataway, New Jersey},
author = {Burghartz, Joachim N. and Sun, Jack Yuan-Chen and Stanis, Carol L. and Mader, Siegfried R. and Warnock, James D.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b7aa16687dc9dc3b30e1beaf20ea6a5c/kevin.konnerth},
doi = {10.1109/16.137329},
interhash = {c20a1e05b92184568c98e84236ec2059},
intrahash = {b7aa16687dc9dc3b30e1beaf20ea6a5c},
issn = {{0018-9383} and {1557-9646}},
journal = {IEEE Transactions on Electron Devices},
keywords = {INES},
month = jun,
number = 6,
pages = {1477-1489},
publisher = {IEEE},
timestamp = {2019-04-11T16:02:57.000+0200},
title = {Identification of perimeter depletion and emitter plug effects in deep-submicrometer, shallow-junction polysilicon emitter bipolar transistors},
volume = 39,
year = 1992
}
