%0 Conference Paper %1 jenkins1993submicron %A Jenkins, Keith A. %A Burghartz, Joachim N. %A Agnello, Paul D. %A Heidel, David F. %A Wong, C. Y. %B Technical digest : International Electron Devices Meeting 1993 : Washington, DC, December 5 - 8, 1993 %C Piscataway, New Jersey %D 1993 %I IEEE %K INES firstnamemissing %P 891-894 %R 10.1109/IEDM.1993.347257 %T Submicron CMOS gate electrode discontinuity : electrical signature and effect on circuit speed %@ 0-7803-1452-2 and 0-7803-1450-6 and 0-7803-1451-4

@inproceedings{jenkins1993submicron, added-at = {2019-04-11T15:56:34.000+0200}, address = {Piscataway, New Jersey}, author = {Jenkins, Keith A. and Burghartz, Joachim N. and Agnello, Paul D. and Heidel, David F. and Wong, C. Y.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2986f96a0408f02adf940d3be57049f18/kevin.konnerth}, booktitle = {Technical digest : International Electron Devices Meeting 1993 : Washington, DC, December 5 - 8, 1993}, doi = {10.1109/IEDM.1993.347257}, eventdate = {1993-12-05/1993-12-08}, eventtitle = {International Electron Devices Meeting 1993}, interhash = {ba6d2c1f725d1f619603c9be3220b9b9}, intrahash = {986f96a0408f02adf940d3be57049f18}, isbn = {{0-7803-1452-2} and {0-7803-1450-6} and {0-7803-1451-4}}, issn = {0163-1918}, keywords = {INES firstnamemissing}, location = {Washington}, pages = {891-894}, publisher = {IEEE}, timestamp = {2019-04-11T13:58:39.000+0200}, title = {Submicron CMOS gate electrode discontinuity : electrical signature and effect on circuit speed}, venue = {Washington D.C., USA}, year = 1993 }