%0 Journal Article %1 Weiser_TPE2024 %A Weiser, Mathias C. J. %A Köhnlein, Viktor %A Kallfass, Ingmar %D 2024 %J IEEE Transactions on Power Electronics %K Switches;Voltage characterization;semiconductor device devices measurement;Current measurement;Electrical measurement;Stress;MODFETs;HEMTs;Device measurements;wide-band-gap resistance %P 1-10 %R 10.1109/TPEL.2024.3376313 %T A Flexible Setup for Dynamic ON-State Resistance Measurements of GaN HEMTs With One-Factor-At-a-Time Capability

@article{Weiser_TPE2024, added-at = {2025-05-26T10:46:09.000+0200}, author = {Weiser, Mathias C. J. and K{\"o}hnlein, Viktor and Kallfass, Ingmar}, bdsk-url-1 = {https://doi.org/10.1109/TPEL.2024.3376313}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24a3ccb7e9a39e0c74a8cb05e28923d52/ingmarkallfass}, date-added = {2024-03-14 09:35:43 +0100}, date-modified = {2024-03-14 09:36:20 +0100}, doi = {10.1109/TPEL.2024.3376313}, interhash = {ae346d1dca79876bfd868fd88a9e9fd4}, intrahash = {4a3ccb7e9a39e0c74a8cb05e28923d52}, journal = {IEEE Transactions on Power Electronics}, keywords = {Switches;Voltage characterization;semiconductor device devices measurement;Current measurement;Electrical measurement;Stress;MODFETs;HEMTs;Device measurements;wide-band-gap resistance}, pages = {1-10}, timestamp = {2025-05-26T10:46:09.000+0200}, title = {A Flexible Setup for Dynamic ON-State Resistance Measurements of GaN HEMTs With One-Factor-At-a-Time Capability}, year = 2024 }