%0 Journal Article %1 journals/mr/ChinoneKTHOC16 %A Chinone, N. %A Kosugi, R. %A Tanaka, Y. %A Harada, Syohei %A Okumura, Hajime %A Cho, Y. %D 2016 %J Microelectronics Reliability %K dblp %P 566-569 %T Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChinoneKTHOC16 %V 64

@article{journals/mr/ChinoneKTHOC16, added-at = {2019-02-11T00:00:00.000+0100}, author = {Chinone, N. and Kosugi, R. and Tanaka, Y. and Harada, Syohei and Okumura, Hajime and Cho, Y.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/210b8e100985860916adf2c6384fa3b0f/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.088}, interhash = {ab0bc17ae7129e532186944ba0ad1882}, intrahash = {10b8e100985860916adf2c6384fa3b0f}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {566-569}, timestamp = {2019-09-27T10:58:13.000+0200}, title = {Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChinoneKTHOC16}, volume = 64, year = 2016 }