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%0 Conference Paper
%1 conf/icicdt/SpessotRSACTHF15
%A Spessot, Alessio
%A Ritzenthaler, Romain
%A Schram, Tom
%A Aoulaiche, Marc
%A Cho, Moonju
%A Toledano-Luque, Maria
%A Horiguchi, Naoto
%A Fazan, Pierre
%B ICICDT
%D 2015
%I IEEE
%K dblp
%P 1-4
%T Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs.
%U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#SpessotRSACTHF15
%@ 978-1-4799-7669-0
@inproceedings{conf/icicdt/SpessotRSACTHF15,
added-at = {2016-05-17T00:00:00.000+0200},
author = {Spessot, Alessio and Ritzenthaler, Romain and Schram, Tom and Aoulaiche, Marc and Cho, Moonju and Toledano-Luque, Maria and Horiguchi, Naoto and Fazan, Pierre},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2abd1babd0a06b08c0a2ae75fbb281c1b/dblp},
booktitle = {ICICDT},
crossref = {conf/icicdt/2015},
ee = {http://dx.doi.org/10.1109/ICICDT.2015.7165890},
interhash = {994f38417356ae417ad30695dd80d4a5},
intrahash = {abd1babd0a06b08c0a2ae75fbb281c1b},
isbn = {978-1-4799-7669-0},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2016-05-18T09:32:14.000+0200},
title = {Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs.},
url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#SpessotRSACTHF15},
year = 2015
}
