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%0 Conference Paper
%1 conf/icicdt/ChoSKARSFHL15
%A Cho, Moonju
%A Spessot, Alessio
%A Kaczer, Ben
%A Aoulaiche, Marc
%A Ritzenthaler, Romain
%A Schram, Tom
%A Fazan, Pierre
%A Horiguchi, Naoto
%A Linten, Dimitri
%B ICICDT
%D 2015
%I IEEE
%K dblp
%P 1-4
%T Off-state stress degradation mechanism on advanced p-MOSFETs.
%U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#ChoSKARSFHL15
%@ 978-1-4799-7669-0
@inproceedings{conf/icicdt/ChoSKARSFHL15,
added-at = {2016-05-17T00:00:00.000+0200},
author = {Cho, Moonju and Spessot, Alessio and Kaczer, Ben and Aoulaiche, Marc and Ritzenthaler, Romain and Schram, Tom and Fazan, Pierre and Horiguchi, Naoto and Linten, Dimitri},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27c4f28a80c190bb786c13e882e48716a/dblp},
booktitle = {ICICDT},
crossref = {conf/icicdt/2015},
ee = {http://dx.doi.org/10.1109/ICICDT.2015.7165893},
interhash = {615ba2b4fe2bc55080eccea380f777c6},
intrahash = {7c4f28a80c190bb786c13e882e48716a},
isbn = {978-1-4799-7669-0},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2016-05-18T09:32:14.000+0200},
title = {Off-state stress degradation mechanism on advanced p-MOSFETs.},
url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#ChoSKARSFHL15},
year = 2015
}
