%0 Journal Article %1 journals/et/SchubertA00 %A Schubert, A. %A Anheier, Walter %D 2000 %J J. Electronic Testing %K dblp %N 3 %P 185-192 %T On Random Pattern Testability of Cryptographic VLSI Cores. %U http://dblp.uni-trier.de/db/journals/et/et16.html#SchubertA00 %V 16

@article{journals/et/SchubertA00, added-at = {2009-03-22T00:00:00.000+0100}, author = {Schubert, A. and Anheier, Walter}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c20ae7e40a2a62453b35648980bbb430/dblp}, ee = {http://dx.doi.org/10.1023/A:1008378912411}, interhash = {521a33e3334b61e609bfdc289b078923}, intrahash = {c20ae7e40a2a62453b35648980bbb430}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 3, pages = {185-192}, timestamp = {2016-02-02T10:07:24.000+0100}, title = {On Random Pattern Testability of Cryptographic VLSI Cores.}, url = {http://dblp.uni-trier.de/db/journals/et/et16.html#SchubertA00}, volume = 16, year = 2000 }