Hybrid Model of Power MOSFET for Soft Failures Estimation Based on Time Domain Reflectometry and Machine Learning
V. Afanasenko, K. Sharma, S. Kamm, and I. Kallfass. 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023-ECCE Asia), page 1849--1854. IEEE, (2023)
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%0 Conference Paper
%1 afanasenko2023hybrid
%A Afanasenko, Valentyna
%A Sharma, Kanuj
%A Kamm, Simon
%A Kallfass, Ingmar
%B 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023-ECCE Asia)
%D 2023
%K 2023ias ias
%P 1849--1854
%T Hybrid Model of Power MOSFET for Soft Failures Estimation Based on Time Domain Reflectometry and Machine Learning
@inproceedings{afanasenko2023hybrid,
added-at = {2024-04-24T11:55:39.000+0200},
author = {Afanasenko, Valentyna and Sharma, Kanuj and Kamm, Simon and Kallfass, Ingmar},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20bc13bd37749f3fc1855a18381c1b70c/brittalenz},
booktitle = {2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023-ECCE Asia)},
interhash = {3dd76a31be97387626ad528eb19015db},
intrahash = {0bc13bd37749f3fc1855a18381c1b70c},
keywords = {2023ias ias},
organization = {IEEE},
pages = {1849--1854},
timestamp = {2024-04-24T11:55:39.000+0200},
title = {Hybrid Model of Power MOSFET for Soft Failures Estimation Based on Time Domain Reflectometry and Machine Learning},
year = 2023
}
