%0 Conference Proceedings %1 kerwien2003mueller %A Kerwien, N %A Rosenthal, E. %A Totzeck, M. %A Osten, Wolfgang %A Tiziani, Hans %C Delft %D 2003 %J EOS Topical Meeting Advanced Imaging Techniques %K ito proceeding %T Mueller matrix microscopy for high-resolution inspection of 2D-microstructures

@proceedings{kerwien2003mueller, added-at = {2019-05-08T13:29:18.000+0200}, address = {Delft}, author = {Kerwien, N and Rosenthal, E. and Totzeck, M. and Osten, Wolfgang and Tiziani, Hans}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2545681b33813adc14d6af6882d04e30c/heidrunkempf}, interhash = {3a69c29afb4ee16f8acadec342f5d012}, intrahash = {545681b33813adc14d6af6882d04e30c}, journal = {EOS Topical Meeting Advanced Imaging Techniques}, keywords = {ito proceeding}, timestamp = {2019-05-08T11:29:18.000+0200}, title = {Mueller matrix microscopy for high-resolution inspection of 2D-microstructures}, year = 2003 }