Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.
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%0 Journal Article
%1 journals/mr/HeerDEGPGS09
%A Heer, Michael
%A Domanski, Krzysztof
%A Esmark, Kai
%A Glaser, Ulrich
%A Pogany, Dionyz
%A Gornik, Erich
%A Stadler, Wolfgang
%D 2009
%J Microelectronics Reliability
%K dblp
%N 12
%P 1455-1464
%T Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.
%U http://dblp.uni-trier.de/db/journals/mr/mr49.html#HeerDEGPGS09
%V 49
@article{journals/mr/HeerDEGPGS09,
added-at = {2010-09-28T00:00:00.000+0200},
author = {Heer, Michael and Domanski, Krzysztof and Esmark, Kai and Glaser, Ulrich and Pogany, Dionyz and Gornik, Erich and Stadler, Wolfgang},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/209976ea1f31d1c39fcae891dd51ef7e4/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2009.06.052},
interhash = {33ed536aaf7cd71ed0a5498e16b15a99},
intrahash = {09976ea1f31d1c39fcae891dd51ef7e4},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 12,
pages = {1455-1464},
timestamp = {2016-02-02T02:01:55.000+0100},
title = {Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#HeerDEGPGS09},
volume = 49,
year = 2009
}
