%0 Conference Paper %1 prakash2023comprehensive %A Prakash, Om %A Novkin, Rodion %A Surabhi, Virinchi Roy %A Krishnamurthy, Prashanth %A Karri, Ramesh %A Khorrami, Farshad %A Amrouch, Hussam %B IEEE ISCAS 2023 symposium proceedings %D 2023 %I IEEE %K ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos %R 10.1109/ISCAS46773.2023.10182096 %T Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning %@ 978-1-6654-5109-3 and 978-1-6654-5110-9

@inproceedings{prakash2023comprehensive, added-at = {2024-02-06T16:35:17.000+0100}, affiliation = {Amrouch, H (Corresponding Author), Univ Stuttgart, Semicond Test & Reliabil STAR, Stuttgart, Germany. Surabhi, Virinchi Roy; Krishnamurthy, Prashanth; Karri, Ramesh; Khorrami, Farshad, NYU, Tandon Sch Engn, Dept ECE, Brooklyn, NY USA. Novkin, Rodion; Amrouch, Hussam, Univ Stuttgart, Semicond Test & Reliabil STAR, Stuttgart, Germany.}, author = {Prakash, Om and Novkin, Rodion and Surabhi, Virinchi Roy and Krishnamurthy, Prashanth and Karri, Ramesh and Khorrami, Farshad and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b5d47810142895d7b49e867e775744e3/unibiblio}, booktitle = {IEEE ISCAS 2023 symposium proceedings}, doi = {10.1109/ISCAS46773.2023.10182096}, eventdate = {2023-05-21/2023-05-25}, eventtitle = {56th IEEE International Symposium on Circuits and Systems (ISCAS)}, interhash = {1fb530a462b1c1a49a0572fb14a895a3}, intrahash = {b5d47810142895d7b49e867e775744e3}, isbn = {{978-1-6654-5109-3} and {978-1-6654-5110-9}}, keywords = {ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos}, language = {eng}, publisher = {IEEE}, research-areas = {Computer Science; Engineering}, series = {IEEE International Symposium on Circuits and Systems}, timestamp = {2024-02-06T16:35:17.000+0100}, title = {Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning}, unique-id = {WOS:001038214602152}, venue = {Monterey, CA}, year = 2023 }