Two-dimensional hole gases are demonstrated in modulation doped SixGe1−x−ySny quantum
wells (QWs), which are embedded in Si0.2Ge0.8 barrier layers. The modulation doped QW
structures are fabricated with molecular beam epitaxy on a thin (100 nm) virtual SiGe substrate
on a (001) oriented Si substrate. The virtual substrate (VS) concept utilizes the Si diffusion into
an as- grown thin, strain relaxed Ge layer during a following annealing step. The lateral lattice
spacing of the SiGe-VS could be varied by the annealing temperature in the range between
830 ◦C and 860 ◦C. Half-hour anneal at 848 ◦C results in nearly strain free growth for the
following Si0.2Ge0.8 barrier layer. Boron doping above an undoped 10 nm spacer on top of the
15 nm QW provides a reservoir for hole transfer from the barrier to the well. Electrical
conductivity, sheet hole density ps and mobility are measured as function of temperature. In all
investigated SixGe1−x−ySny channels the Hall measurements show the typical freeze out of
holes outside the QW. Alloy scattering dominates the low-temperature mobility by adding Sn or
Si to the Ge reference well. A linear relationship for the charge transfer from the modulation
doping into the undoped SixGe1−x−ySny channel as function of the lattice mismatch between the
channel material and the matrix material could be found at low-temperatures (8 K). An
analytical model for this charge transfer confirms the nearly linear relationship by considering
the triangular shape of the potential in modulation doped QW structures.
Description
Two-dimensional hole gases in SiGeSn alloys - NASA/ADS
%0 Journal Article
%1 2022SeScT..37e5009O
%A Oehme, Michael
%A Kasper, Erich
%A Weißhaupt, David
%A Sigle, Eric
%A Hersperger, Tim
%A Wanitzek, Maurice
%A Schwarz, Daniel
%D 2022
%J Semiconductor Science Technology
%K iht journal
%N 5
%P 055009
%R 10.1088/1361-6641/ac61fe
%T Two-dimensional hole gases in SiGeSn alloys
%V 37
%X Two-dimensional hole gases are demonstrated in modulation doped SixGe1−x−ySny quantum
wells (QWs), which are embedded in Si0.2Ge0.8 barrier layers. The modulation doped QW
structures are fabricated with molecular beam epitaxy on a thin (100 nm) virtual SiGe substrate
on a (001) oriented Si substrate. The virtual substrate (VS) concept utilizes the Si diffusion into
an as- grown thin, strain relaxed Ge layer during a following annealing step. The lateral lattice
spacing of the SiGe-VS could be varied by the annealing temperature in the range between
830 ◦C and 860 ◦C. Half-hour anneal at 848 ◦C results in nearly strain free growth for the
following Si0.2Ge0.8 barrier layer. Boron doping above an undoped 10 nm spacer on top of the
15 nm QW provides a reservoir for hole transfer from the barrier to the well. Electrical
conductivity, sheet hole density ps and mobility are measured as function of temperature. In all
investigated SixGe1−x−ySny channels the Hall measurements show the typical freeze out of
holes outside the QW. Alloy scattering dominates the low-temperature mobility by adding Sn or
Si to the Ge reference well. A linear relationship for the charge transfer from the modulation
doping into the undoped SixGe1−x−ySny channel as function of the lattice mismatch between the
channel material and the matrix material could be found at low-temperatures (8 K). An
analytical model for this charge transfer confirms the nearly linear relationship by considering
the triangular shape of the potential in modulation doped QW structures.
@article{2022SeScT..37e5009O,
abstract = {Two-dimensional hole gases are demonstrated in modulation doped SixGe1−x−ySny quantum
wells (QWs), which are embedded in Si0.2Ge0.8 barrier layers. The modulation doped QW
structures are fabricated with molecular beam epitaxy on a thin (100 nm) virtual SiGe substrate
on a (001) oriented Si substrate. The virtual substrate (VS) concept utilizes the Si diffusion into
an as- grown thin, strain relaxed Ge layer during a following annealing step. The lateral lattice
spacing of the SiGe-VS could be varied by the annealing temperature in the range between
830 ◦C and 860 ◦C. Half-hour anneal at 848 ◦C results in nearly strain free growth for the
following Si0.2Ge0.8 barrier layer. Boron doping above an undoped 10 nm spacer on top of the
15 nm QW provides a reservoir for hole transfer from the barrier to the well. Electrical
conductivity, sheet hole density ps and mobility are measured as function of temperature. In all
investigated SixGe1−x−ySny channels the Hall measurements show the typical freeze out of
holes outside the QW. Alloy scattering dominates the low-temperature mobility by adding Sn or
Si to the Ge reference well. A linear relationship for the charge transfer from the modulation
doping into the undoped SixGe1−x−ySny channel as function of the lattice mismatch between the
channel material and the matrix material could be found at low-temperatures (8 K). An
analytical model for this charge transfer confirms the nearly linear relationship by considering
the triangular shape of the potential in modulation doped QW structures.},
added-at = {2022-05-25T10:09:08.000+0200},
adsnote = {Provided by the SAO/NASA Astrophysics Data System},
adsurl = {https://ui.adsabs.harvard.edu/abs/2022SeScT..37e5009O},
author = {Oehme, Michael and Kasper, Erich and Weißhaupt, David and Sigle, Eric and Hersperger, Tim and Wanitzek, Maurice and Schwarz, Daniel},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29eb0a00722d6620192bad82cb95dab44/ihtpublikation},
description = {Two-dimensional hole gases in SiGeSn alloys - NASA/ADS},
doi = {10.1088/1361-6641/ac61fe},
eid = {055009},
interhash = {52a35d4dc02a5a9a2ea1bf4d4e6e8103},
intrahash = {9eb0a00722d6620192bad82cb95dab44},
journal = {Semiconductor Science Technology},
keywords = {iht journal},
month = may,
number = 5,
pages = 055009,
timestamp = {2022-05-25T08:09:08.000+0200},
title = {Two-dimensional hole gases in SiGeSn alloys},
volume = 37,
year = 2022
}