Characterizing the switching losses of wide bandgap semiconductor devices requires wide bandwidth measurement equipment with the smallest possible insertion inductance added to the commutation path by the current sensor. A common current measurement approach is using low-cost off-the-shelf SMD resistors and measure the voltage drop. This SMD shunt approach has a limited bandwidth due to parasitic inductances. In this work, an evaluation of such a low-cost current shunt is performed. The influences and constraints that limit the bandwidth are investigated. The design of a compensation network and the resulting bandwidth improvement are examined. Based on the theoretical discussion, a compact current shunt is designed, that allows a simple integration into the commutation path while adding a low insertion inductance. The measurement results show, that the common measurement approach can reach a bandwidth of several hundred MHz if the design constraints are met and can be further extended by a compensation network.
%0 Conference Paper
%1 10264595
%A Ziegler, Philipp
%A Haarer, Jörg
%A Marx, Philipp
%A Eckstein, Mattea
%A Haspel, André
%A Roth-Stielow, Jörg
%B 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
%D 2023
%K ecce eckstein epe haarer haspel ilea marx roth-stielow ziegler
%P 1-9
%T Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices
%U https://ieeexplore.ieee.org/document/10264595
%X Characterizing the switching losses of wide bandgap semiconductor devices requires wide bandwidth measurement equipment with the smallest possible insertion inductance added to the commutation path by the current sensor. A common current measurement approach is using low-cost off-the-shelf SMD resistors and measure the voltage drop. This SMD shunt approach has a limited bandwidth due to parasitic inductances. In this work, an evaluation of such a low-cost current shunt is performed. The influences and constraints that limit the bandwidth are investigated. The design of a compensation network and the resulting bandwidth improvement are examined. Based on the theoretical discussion, a compact current shunt is designed, that allows a simple integration into the commutation path while adding a low insertion inductance. The measurement results show, that the common measurement approach can reach a bandwidth of several hundred MHz if the design constraints are met and can be further extended by a compensation network.
@inproceedings{10264595,
abstract = {Characterizing the switching losses of wide bandgap semiconductor devices requires wide bandwidth measurement equipment with the smallest possible insertion inductance added to the commutation path by the current sensor. A common current measurement approach is using low-cost off-the-shelf SMD resistors and measure the voltage drop. This SMD shunt approach has a limited bandwidth due to parasitic inductances. In this work, an evaluation of such a low-cost current shunt is performed. The influences and constraints that limit the bandwidth are investigated. The design of a compensation network and the resulting bandwidth improvement are examined. Based on the theoretical discussion, a compact current shunt is designed, that allows a simple integration into the commutation path while adding a low insertion inductance. The measurement results show, that the common measurement approach can reach a bandwidth of several hundred MHz if the design constraints are met and can be further extended by a compensation network.},
added-at = {2023-10-11T10:52:17.000+0200},
author = {Ziegler, Philipp and Haarer, Jörg and Marx, Philipp and Eckstein, Mattea and Haspel, André and Roth-Stielow, Jörg},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/275040501d0f8830f68fe3f6e4431af3e/ilea},
booktitle = {2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)},
interhash = {306ccdfaca9d0f350ae263d5dd9ea7ee},
intrahash = {75040501d0f8830f68fe3f6e4431af3e},
keywords = {ecce eckstein epe haarer haspel ilea marx roth-stielow ziegler},
month = {Sep.},
pages = {1-9},
timestamp = {2023-10-12T11:09:37.000+0200},
title = {Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices},
url = {https://ieeexplore.ieee.org/document/10264595},
year = 2023
}
