Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. There is a huge potential how test methods can benefit from recent breakthroughs in domains such as artificial intelligence, data analytics, virtual/augmented reality, and security. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. It is funded by Advantest, one of the world leaders in automatic test equipment. In this paper, we describe the overall philosophy of the Graduate School and the specific scientific questions targeted by its ten projects.
Description
Intelligent Methods for Test and Reliability | IEEE Conference Publication | IEEE Xplore
%0 Conference Paper
%1 9774526
%A Amrouch, H.
%A Anders, J.
%A Becker, S.
%A Betka, M.
%A Bleher, G.
%A Domanski, P.
%A Elhamawy, N.
%A Ertl, T.
%A Gatzastras, A.
%A Genssler, P.
%A Hasler, S.
%A Heinrich, M.
%A van Hoorn, A.
%A Jafarzadeh, H.
%A Kallfass, I.
%A Klemme, F.
%A Koch, S.
%A Küsters, R.
%A Lalama, A.
%A Latty, R.
%A Liao, Y.
%A Lylina, N.
%A Haghi, Z. Najafi
%A Pflüger, D.
%A Polian, I.
%A Rivoir, J.
%A Sauer, M.
%A Schwachhofer, D.
%A Templin, S.
%A Volmer, C.
%A Wagner, S.
%A Weiskopf, D.
%A Wunderlich, H.-J.
%A Yang, B.
%A Zimmermann, M.
%B 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
%D 2022
%K
%P 969-974
%R 10.23919/DATE54114.2022.9774526
%T Intelligent Methods for Test and Reliability
%X Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. There is a huge potential how test methods can benefit from recent breakthroughs in domains such as artificial intelligence, data analytics, virtual/augmented reality, and security. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. It is funded by Advantest, one of the world leaders in automatic test equipment. In this paper, we describe the overall philosophy of the Graduate School and the specific scientific questions targeted by its ten projects.
@inproceedings{9774526,
abstract = {Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. There is a huge potential how test methods can benefit from recent breakthroughs in domains such as artificial intelligence, data analytics, virtual/augmented reality, and security. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. It is funded by Advantest, one of the world leaders in automatic test equipment. In this paper, we describe the overall philosophy of the Graduate School and the specific scientific questions targeted by its ten projects.},
added-at = {2023-10-19T16:31:48.000+0200},
author = {Amrouch, H. and Anders, J. and Becker, S. and Betka, M. and Bleher, G. and Domanski, P. and Elhamawy, N. and Ertl, T. and Gatzastras, A. and Genssler, P. and Hasler, S. and Heinrich, M. and van Hoorn, A. and Jafarzadeh, H. and Kallfass, I. and Klemme, F. and Koch, S. and Küsters, R. and Lalama, A. and Latty, R. and Liao, Y. and Lylina, N. and Haghi, Z. Najafi and Pflüger, D. and Polian, I. and Rivoir, J. and Sauer, M. and Schwachhofer, D. and Templin, S. and Volmer, C. and Wagner, S. and Weiskopf, D. and Wunderlich, H.-J. and Yang, B. and Zimmermann, M.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23e578141795076fbe0ba81d283d455bc/ipvs-sc},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)},
description = {Intelligent Methods for Test and Reliability | IEEE Conference Publication | IEEE Xplore},
doi = {10.23919/DATE54114.2022.9774526},
interhash = {c2d43d39d0b7487b5ec12f643cf5c48f},
intrahash = {3e578141795076fbe0ba81d283d455bc},
issn = {1558-1101},
keywords = {},
month = {March},
pages = {969-974},
timestamp = {2023-10-19T16:31:48.000+0200},
title = {Intelligent Methods for Test and Reliability},
year = 2022
}