%0 Journal Article %1 Schnitzler_DMC2023 %A Schnitzler, R. %A Koch, D. %A Gomes, E.S. %A Kallfass, I. %D 2023 %J in Proc. IEEE Design Methodologies Conference (DMC), Miami %K PUMA in update %T Fully Modular, Dynamic SiC and GaN Testbench with Automated Temperature and Gate-Voltage Characterization

@article{Schnitzler_DMC2023, added-at = {2025-05-26T10:46:09.000+0200}, author = {Schnitzler, R. and Koch, D. and Gomes, E.S. and Kallfass, I.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23dfef9d6480995c6f92d3d127f5ec6d7/ingmarkallfass}, date-added = {2023-12-08 13:28:44 +0100}, date-modified = {2023-12-08 13:29:47 +0100}, interhash = {872ea149b7ac1fb60033a059d5870453}, intrahash = {3dfef9d6480995c6f92d3d127f5ec6d7}, journal = {in Proc. IEEE Design Methodologies Conference (DMC), Miami}, keywords = {PUMA in update}, month = {Sep.}, timestamp = {2025-05-26T10:46:09.000+0200}, title = {Fully Modular, Dynamic SiC and GaN Testbench with Automated Temperature and Gate-Voltage Characterization}, year = 2023 }