%0 Journal Article
%1 frohberg2000
%A Frohberg, K.
%A Wehner, B.
%A Trui, B.
%A Wolf, K.
%A Paufler, P.
%A Kueck, Heinz
%B Materials Science Forum
%D 2000
%I Trans Tech Publications Ltd
%J Materials Science Forum
%K kueck ifm_article from:holgerruehl
%P 457-462
%R 10.4028/www.scientific.net/MSF.321-324.457
%T Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods
%V 321-324
@article{frohberg2000,
added-at = {2023-06-19T20:51:21.000+0200},
author = {Frohberg, K. and Wehner, B. and Trui, B. and Wolf, K. and Paufler, P. and Kueck, Heinz},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2024cbab676fb0e52679fdeafbb2103f8/ifm},
doi = {10.4028/www.scientific.net/MSF.321-324.457},
interhash = {d814b5c920802ca171f719b63181756a},
intrahash = {024cbab676fb0e52679fdeafbb2103f8},
journal = {Materials Science Forum},
keywords = {kueck ifm_article from:holgerruehl},
month = {1},
pages = {457-462},
publisher = {Trans Tech Publications Ltd},
series = {Materials Science Forum},
timestamp = {2023-06-19T20:51:21.000+0200},
title = {Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods},
volume = {321-324},
year = 2000
}