%0 Conference Paper %1 conf/irps/NovakPBLACPNRN15 %A Novak, S. %A Parker, C. %A Becher, D. %A Liu, M. %A Agostinelli, M. %A Chahal, M. %A Packan, P. %A Nayak, P. %A Ramey, S. %A Natarajan, S. %B IRPS %D 2015 %I IEEE %K dblp %P 2 %T Transistor aging and reliability in 14nm tri-gate technology. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#NovakPBLACPNRN15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/NovakPBLACPNRN15, added-at = {2016-03-07T00:00:00.000+0100}, author = {Novak, S. and Parker, C. and Becher, D. and Liu, M. and Agostinelli, M. and Chahal, M. and Packan, P. and Nayak, P. and Ramey, S. and Natarajan, S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/298ae5b695cb0fe0e2cf33febf4940d29/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {http://dx.doi.org/10.1109/IRPS.2015.7112692}, interhash = {ffb1c1fecfa5e3c6f45594669be7e88d}, intrahash = {98ae5b695cb0fe0e2cf33febf4940d29}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2016-03-08T10:33:19.000+0100}, title = {Transistor aging and reliability in 14nm tri-gate technology.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#NovakPBLACPNRN15}, year = 2015 }