%0 Journal Article %1 journals/tvlsi/NakamuraCSF07 %A Nakamura, Yoshiyuki %A Clouqueur, Thomas %A Saluja, Kewal K. %A Fujiwara, Hideo %D 2007 %J IEEE Trans. VLSI Syst. %K dblp %N 7 %P 790-800 %T Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi15.html#NakamuraCSF07 %V 15

@article{journals/tvlsi/NakamuraCSF07, added-at = {2007-11-04T00:00:00.000+0100}, author = {Nakamura, Yoshiyuki and Clouqueur, Thomas and Saluja, Kewal K. and Fujiwara, Hideo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e6dcbe87fa3b44df9ff3866f5b18a3fe/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2007.899235}, interhash = {ff7dc46549cced44fa727427cde024f4}, intrahash = {e6dcbe87fa3b44df9ff3866f5b18a3fe}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 7, pages = {790-800}, timestamp = {2016-02-02T02:12:13.000+0100}, title = {Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi15.html#NakamuraCSF07}, volume = 15, year = 2007 }