%0 Conference Paper %1 conf/vts/CremouxFGLP96 %A Cremoux, S. %A Fagot, Christophe %A Girard, Patrick %A Landrault, Christian %A Pravossoudovitch, Serge %B VTS %D 1996 %I IEEE Computer Society %K dblp %P 296-301 %T A new test pattern generation method for delay fault testing. %U http://dblp.uni-trier.de/db/conf/vts/vts1996.html#CremouxFGLP96 %@ 0-8186-7304-4

@inproceedings{conf/vts/CremouxFGLP96, added-at = {2014-11-05T00:00:00.000+0100}, author = {Cremoux, S. and Fagot, Christophe and Girard, Patrick and Landrault, Christian and Pravossoudovitch, Serge}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29e258d84d92c22a821a35d2b4a041075/dblp}, booktitle = {VTS}, crossref = {conf/vts/1996}, ee = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510871}, interhash = {ff45ce9fb3ccb64cd07082a1390a5952}, intrahash = {9e258d84d92c22a821a35d2b4a041075}, isbn = {0-8186-7304-4}, keywords = {dblp}, pages = {296-301}, publisher = {IEEE Computer Society}, timestamp = {2016-09-07T09:33:45.000+0200}, title = {A new test pattern generation method for delay fault testing.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1996.html#CremouxFGLP96}, year = 1996 }