%0 Conference Paper %1 conf/vts/IwaiNIO05 %A Iwai, Hitoshi %A Nakayama, Atsushi %A Itoga, Naoko %A Omata, Kotaro %B VTS %D 2005 %I IEEE Computer Society %K dblp %P 85-89 %T Cantilever Type Probe Card for At-Speed Memory Test on Wafer. %U http://dblp.uni-trier.de/db/conf/vts/vts2005.html#IwaiNIO05 %@ 0-7695-2314-5

@inproceedings{conf/vts/IwaiNIO05, added-at = {2014-11-05T00:00:00.000+0100}, author = {Iwai, Hitoshi and Nakayama, Atsushi and Itoga, Naoko and Omata, Kotaro}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2bff7098cf4ea511ddca8bb85c834ff4d/dblp}, booktitle = {VTS}, crossref = {conf/vts/2005}, ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.34}, interhash = {fd49e0ace043f3ef369d0b2c80de21ea}, intrahash = {bff7098cf4ea511ddca8bb85c834ff4d}, isbn = {0-7695-2314-5}, keywords = {dblp}, pages = {85-89}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T13:39:17.000+0100}, title = {Cantilever Type Probe Card for At-Speed Memory Test on Wafer.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2005.html#IwaiNIO05}, year = 2005 }