%0 Journal Article %1 journals/mr/TorrenteCRVR0G15 %A Torrente, Giulio %A Coignus, Jean %A Renard, Sophie %A Vernhet, Alexandre %A Reimbold, Gilles %A Roy, David %A Ghibaudo, Gérard %D 2015 %J Microelectronics Reliability %K dblp %N 9-10 %P 1417-1421 %T Physically-based extraction methodology for accurate MOSFET degradation assessment. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#TorrenteCRVR0G15 %V 55

@article{journals/mr/TorrenteCRVR0G15, added-at = {2015-10-31T00:00:00.000+0100}, author = {Torrente, Giulio and Coignus, Jean and Renard, Sophie and Vernhet, Alexandre and Reimbold, Gilles and Roy, David and Ghibaudo, Gérard}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22f028dd38cdf0255b957dff441d5cb88/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2015.06.063}, interhash = {fce64042da8687217fb9c126849d1cf0}, intrahash = {2f028dd38cdf0255b957dff441d5cb88}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1417-1421}, timestamp = {2016-02-02T02:00:17.000+0100}, title = {Physically-based extraction methodology for accurate MOSFET degradation assessment.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#TorrenteCRVR0G15}, volume = 55, year = 2015 }