%0 Journal Article %1 journals/mr/AtanassovaPN08 %A Atanassova, Elena %A Paskaleva, Albena %A Novkovski, N. %D 2008 %J Microelectronics Reliability %K dblp %N 4 %P 514-525 %T Effects of the metal gate on the stress-induced traps in Ta2O5/SiO2 stacks. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#AtanassovaPN08 %V 48

@article{journals/mr/AtanassovaPN08, added-at = {2015-02-06T00:00:00.000+0100}, author = {Atanassova, Elena and Paskaleva, Albena and Novkovski, N.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2cb899346484578b62e5bc9175e1a4817/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.11.002}, interhash = {faadcc57ed2713c07e52887f98228b5e}, intrahash = {cb899346484578b62e5bc9175e1a4817}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 4, pages = {514-525}, timestamp = {2016-02-02T02:00:57.000+0100}, title = {Effects of the metal gate on the stress-induced traps in Ta2O5/SiO2 stacks.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#AtanassovaPN08}, volume = 48, year = 2008 }