%0 Journal Article %1 journals/mr/SchenkelPWAF01 %A Schenkel, Michael %A Pfäffli, Paul %A Wilkening, Wolfgang %A Aemmer, D. %A Fichtner, Wolfgang %D 2001 %J Microelectronics Reliability %K dblp %N 6 %P 815-822 %T Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#SchenkelPWAF01 %V 41

@article{journals/mr/SchenkelPWAF01, added-at = {2007-03-26T00:00:00.000+0200}, author = {Schenkel, Michael and Pfäffli, Paul and Wilkening, Wolfgang and Aemmer, D. and Fichtner, Wolfgang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/290c84bb5ef5ab1cb39d365ebdc7d5960/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(01)00028-2}, interhash = {f922a03d0e5de564f55518c0ee51776e}, intrahash = {90c84bb5ef5ab1cb39d365ebdc7d5960}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 6, pages = {815-822}, timestamp = {2016-02-02T02:02:06.000+0100}, title = {Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#SchenkelPWAF01}, volume = 41, year = 2001 }