%0 Conference Paper %1 conf/itc/LiDH83 %A Li, R. Y. %A Diehl, S. C. %A Harrison, S. %B ITC %D 1983 %I IEEE Computer Society %K dblp %P 366-370 %T Power Supply Noise Testing of VLSI Chips. %U http://dblp.uni-trier.de/db/conf/itc/itc1983.html#LiDH83

@inproceedings{conf/itc/LiDH83, added-at = {2002-11-05T00:00:00.000+0100}, author = {Li, R. Y. and Diehl, S. C. and Harrison, S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d6a8fcd92528a81408f34e3ab74b2d45/dblp}, booktitle = {ITC}, crossref = {conf/itc/1983}, interhash = {f35c2ac50df0ecb269f88bd14e077524}, intrahash = {d6a8fcd92528a81408f34e3ab74b2d45}, keywords = {dblp}, pages = {366-370}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:32:07.000+0100}, title = {Power Supply Noise Testing of VLSI Chips.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1983.html#LiDH83}, year = 1983 }