%0 Journal Article %1 journals/mr/MullerKR03 %A Müller, J. %A Klein, J. %A Rayho, J. %D 2003 %J Microelectronics Reliability %K dblp %N 3 %P 371-375 %T In-process verification of MLC substrates. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#MullerKR03 %V 43

@article{journals/mr/MullerKR03, added-at = {2007-03-25T00:00:00.000+0100}, author = {Müller, J. and Klein, J. and Rayho, J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24a02043c7e2318bd07d631cf9d6d01b4/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(02)00345-1}, interhash = {ebed315c02b548a02278d39a44b195f2}, intrahash = {4a02043c7e2318bd07d631cf9d6d01b4}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 3, pages = {371-375}, timestamp = {2016-02-02T01:59:36.000+0100}, title = {In-process verification of MLC substrates.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#MullerKR03}, volume = 43, year = 2003 }