%0 Conference Paper %1 conf/bcfic/KarmaniKMKHR12 %A Karmani, Mouna %A Khedhiri, Chiraz %A Man, Ka Lok %A Krilavicius, Tomas %A Hamdi, Belgacem %A Rahmani, Amir-Mohammad %B BCFIC %D 2012 %I IEEE %K dblp %P 117-120 %T A self-test and self-repair approach for analog integrated circuits. %U http://dblp.uni-trier.de/db/conf/bcfic/bcfic2012.html#KarmaniKMKHR12 %@ 978-1-4673-1672-9

@inproceedings{conf/bcfic/KarmaniKMKHR12, added-at = {2019-05-29T00:00:00.000+0200}, author = {Karmani, Mouna and Khedhiri, Chiraz and Man, Ka Lok and Krilavicius, Tomas and Hamdi, Belgacem and Rahmani, Amir-Mohammad}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/240d8a18b28ec6b2ab57e4f365f714431/dblp}, booktitle = {BCFIC}, crossref = {conf/bcfic/2012}, ee = {https://doi.org/10.1109/BCFIC.2012.6217990}, interhash = {ebb65f8788a0554a33025c5ee31aa167}, intrahash = {40d8a18b28ec6b2ab57e4f365f714431}, isbn = {978-1-4673-1672-9}, keywords = {dblp}, pages = {117-120}, publisher = {IEEE}, timestamp = {2019-09-27T15:39:55.000+0200}, title = {A self-test and self-repair approach for analog integrated circuits.}, url = {http://dblp.uni-trier.de/db/conf/bcfic/bcfic2012.html#KarmaniKMKHR12}, year = 2012 }