%0 Journal Article %1 journals/mr/KimJPMK01 %A Kim, Young Pil %A Jin, Beom Jun %A Park, Young Wook %A Moon, Joo Tae %A Kim, Sang U. %D 2001 %J Microelectronics Reliability %K dblp %N 9-10 %P 1301-1305 %T Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#KimJPMK01 %V 41

@article{journals/mr/KimJPMK01, added-at = {2015-01-20T00:00:00.000+0100}, author = {Kim, Young Pil and Jin, Beom Jun and Park, Young Wook and Moon, Joo Tae and Kim, Sang U.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/258d7291631426caa5ca8f87f14e5fbe4/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(01)00192-5}, interhash = {eab88850dd43b936a5a1b6ee35b37cb6}, intrahash = {58d7291631426caa5ca8f87f14e5fbe4}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1301-1305}, timestamp = {2016-02-02T02:02:03.000+0100}, title = {Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#KimJPMK01}, volume = 41, year = 2001 }