%0 Journal Article %1 journals/mr/DammannBBKKGSQ18 %A Dammann, Maximilian %A Baeumler, M. %A Brückner, P. %A Kemmer, T. %A Konstanzer, H. %A Graff, Andreas %A Simon-Najasek, Michél %A Quay, Rüdiger %D 2018 %J Microelectronics Reliability %K dblp %P 385-388 %T Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. %U http://dblp.uni-trier.de/db/journals/mr/mr88.html#DammannBBKKGSQ18 %V 88-90

@article{journals/mr/DammannBBKKGSQ18, added-at = {2019-06-30T00:00:00.000+0200}, author = {Dammann, Maximilian and Baeumler, M. and Brückner, P. and Kemmer, T. and Konstanzer, H. and Graff, Andreas and Simon-Najasek, Michél and Quay, Rüdiger}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d7e7a8ed1f89ca45212b908ecbd840bd/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.06.042}, interhash = {e6b3046a9c24113d282d1f6f8532ec73}, intrahash = {d7e7a8ed1f89ca45212b908ecbd840bd}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {385-388}, timestamp = {2019-09-27T10:58:34.000+0200}, title = {Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#DammannBBKKGSQ18}, volume = {88-90}, year = 2018 }