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%0 Conference Paper
%1 conf/icip/JanssensBDVNS15
%A Janssens, Eline
%A Beenhouwer, Jan De
%A Dael, Mattias Van
%A Verboven, Pieter
%A Nicolaï, Bart M.
%A Sijbers, Jan
%B ICIP
%D 2015
%I IEEE
%K dblp
%P 917-921
%T Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system.
%U http://dblp.uni-trier.de/db/conf/icip/icip2015.html#JanssensBDVNS15
%@ 978-1-4799-8339-1
@inproceedings{conf/icip/JanssensBDVNS15,
added-at = {2019-06-02T00:00:00.000+0200},
author = {Janssens, Eline and Beenhouwer, Jan De and Dael, Mattias Van and Verboven, Pieter and Nicolaï, Bart M. and Sijbers, Jan},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d951e7ad7a645f332a3b0555468964be/dblp},
booktitle = {ICIP},
crossref = {conf/icip/2015},
ee = {https://www.wikidata.org/entity/Q62663813},
interhash = {e57313261200ac8f5358ca8b394e8e98},
intrahash = {d951e7ad7a645f332a3b0555468964be},
isbn = {978-1-4799-8339-1},
keywords = {dblp},
pages = {917-921},
publisher = {IEEE},
timestamp = {2019-09-27T19:53:09.000+0200},
title = {Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system.},
url = {http://dblp.uni-trier.de/db/conf/icip/icip2015.html#JanssensBDVNS15},
year = 2015
}
