%0 Journal Article %1 journals/tvlsi/CarbognaniBFKF08 %A Carbognani, Flavio %A Bürgin, Felix %A Felber, Norbert %A Kaeslin, Hubert %A Fichtner, Wolfgang %D 2008 %J IEEE Trans. VLSI Syst. %K dblp %N 7 %P 830-836 %T Transmission Gates Combined With Level-Restoring CMOS Gates Reduce Glitches in Low-Power Low-Frequency Multipliers. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi16.html#CarbognaniBFKF08 %V 16

@article{journals/tvlsi/CarbognaniBFKF08, added-at = {2009-02-16T00:00:00.000+0100}, author = {Carbognani, Flavio and Bürgin, Felix and Felber, Norbert and Kaeslin, Hubert and Fichtner, Wolfgang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28eb9a7b81835a0bf4ef1b6b25556ec69/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2008.2000457}, interhash = {e458d9f34c4fb064ec90593e66ef7627}, intrahash = {8eb9a7b81835a0bf4ef1b6b25556ec69}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 7, pages = {830-836}, timestamp = {2016-02-02T02:12:54.000+0100}, title = {Transmission Gates Combined With Level-Restoring CMOS Gates Reduce Glitches in Low-Power Low-Frequency Multipliers.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi16.html#CarbognaniBFKF08}, volume = 16, year = 2008 }