%0 Journal Article %1 journals/mr/OhyamaNSCTHOK01 %A Ohyama, Hidenori %A Nakabayashi, M. %A Simoen, Eddy %A Claeys, Cor %A Tanaka, T. %A Hirao, T. %A Onada, S. %A Kobayashi, K. %D 2001 %J Microelectronics Reliability %K dblp %N 9-10 %P 1443-1448 %T Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#OhyamaNSCTHOK01 %V 41

@article{journals/mr/OhyamaNSCTHOK01, added-at = {2015-02-05T00:00:00.000+0100}, author = {Ohyama, Hidenori and Nakabayashi, M. and Simoen, Eddy and Claeys, Cor and Tanaka, T. and Hirao, T. and Onada, S. and Kobayashi, K.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/206e101d5b9f267469ee75110a173e461/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(01)00182-2}, interhash = {e045e4dd4f2f94a71e83c00d7069642d}, intrahash = {06e101d5b9f267469ee75110a173e461}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1443-1448}, timestamp = {2016-02-02T02:00:09.000+0100}, title = {Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#OhyamaNSCTHOK01}, volume = 41, year = 2001 }