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%0 Journal Article
%1 journals/mr/SoldnerSHTGSCID07
%A Soldner, Wolfgang
%A Streibl, Martin
%A Hodel, U.
%A Tiebout, Marc
%A Gossner, Harald
%A Schmitt-Landsiedel, Doris
%A Chun, Jung-Hoon
%A Ito, Choshu
%A Dutton, Robert W.
%D 2007
%J Microelectronics Reliability
%K dblp
%N 7
%P 1008-1015
%T RF ESD protection strategies: Codesign vs. low-C protection.
%U http://dblp.uni-trier.de/db/journals/mr/mr47.html#SoldnerSHTGSCID07
%V 47
@article{journals/mr/SoldnerSHTGSCID07,
added-at = {2011-04-20T00:00:00.000+0200},
author = {Soldner, Wolfgang and Streibl, Martin and Hodel, U. and Tiebout, Marc and Gossner, Harald and Schmitt-Landsiedel, Doris and Chun, Jung-Hoon and Ito, Choshu and Dutton, Robert W.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26fa0171a92e2b8d8d8aacbeef6a33feb/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2006.11.007},
interhash = {df0ff6bd0ccde10a607c14da7e9d41eb},
intrahash = {6fa0171a92e2b8d8d8aacbeef6a33feb},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 7,
pages = {1008-1015},
timestamp = {2016-02-02T02:01:55.000+0100},
title = {RF ESD protection strategies: Codesign vs. low-C protection.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#SoldnerSHTGSCID07},
volume = 47,
year = 2007
}