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%0 Conference Paper
%1 conf/itc/VrankenWFL01
%A Vranken, Harald P. E.
%A Waayers, Tom
%A Fleury, Hérvé
%A Lelouvier, David
%B ITC
%D 2001
%I IEEE Computer Society
%K dblp
%P 738-747
%T Enhanced reduced pin-count test for full-scan design.
%U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#VrankenWFL01
%@ 0-7803-7169-0
@inproceedings{conf/itc/VrankenWFL01,
added-at = {2015-08-26T00:00:00.000+0200},
author = {Vranken, Harald P. E. and Waayers, Tom and Fleury, Hérvé and Lelouvier, David},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/21c0d5ee1af07f68a81c16dd1d8e87790/dblp},
booktitle = {ITC},
crossref = {conf/itc/2001},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2001.966695},
interhash = {def8aa50a0e3d54789ae387329625bf6},
intrahash = {1c0d5ee1af07f68a81c16dd1d8e87790},
isbn = {0-7803-7169-0},
keywords = {dblp},
pages = {738-747},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T15:31:51.000+0100},
title = {Enhanced reduced pin-count test for full-scan design.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#VrankenWFL01},
year = 2001
}
