%0 Conference Paper %1 conf/isscc/YoonJKKLKSKHKKL16 %A Yoon, Young Jun %A Jeon, Byung Deuk %A Kim, Byung Soo %A Kim, Ki Up %A Lee, Tae Yong %A Kwak, Nohhyup %A Shin, Woo Yeol %A Kim, Na Yeon %A Hong, Yunseok %A Kang, Kyeong Pil %A Ka, Dong Yoon %A Lee, Seong Ju %A Kim, Yong Sun %A Noh, Young Kyu %A Kim, Jaehoon %A Kang, Dong Keum %A Song, Ho Uk %A Kim, Hyeon Gon %A Oh, Jonghoon %B ISSCC %D 2016 %I IEEE %K dblp %P 320-322 %T 18.4 An 1.1V 68.2GB/s 8Gb Wide-IO2 DRAM with non-contact microbump I/O test scheme. %U http://dblp.uni-trier.de/db/conf/isscc/isscc2016.html#YoonJKKLKSKHKKL16 %@ 978-1-4673-9467-3

@inproceedings{conf/isscc/YoonJKKLKSKHKKL16, added-at = {2016-03-02T00:00:00.000+0100}, author = {Yoon, Young Jun and Jeon, Byung Deuk and Kim, Byung Soo and Kim, Ki Up and Lee, Tae Yong and Kwak, Nohhyup and Shin, Woo Yeol and Kim, Na Yeon and Hong, Yunseok and Kang, Kyeong Pil and Ka, Dong Yoon and Lee, Seong Ju and Kim, Yong Sun and Noh, Young Kyu and Kim, Jaehoon and Kang, Dong Keum and Song, Ho Uk and Kim, Hyeon Gon and Oh, Jonghoon}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28fb08b0310d7a6e55e107cde1d22301e/dblp}, booktitle = {ISSCC}, crossref = {conf/isscc/2016}, ee = {http://dx.doi.org/10.1109/ISSCC.2016.7418036}, interhash = {dcb8162088380f94467d0ca1d3cbd8dc}, intrahash = {8fb08b0310d7a6e55e107cde1d22301e}, isbn = {978-1-4673-9467-3}, keywords = {dblp}, pages = {320-322}, publisher = {IEEE}, timestamp = {2016-03-03T10:32:31.000+0100}, title = {18.4 An 1.1V 68.2GB/s 8Gb Wide-IO2 DRAM with non-contact microbump I/O test scheme.}, url = {http://dblp.uni-trier.de/db/conf/isscc/isscc2016.html#YoonJKKLKSKHKKL16}, year = 2016 }