%0 Journal Article %1 journals/mr/BriatVBBDW10 %A Briat, Olivier %A Vinassa, Jean-Michel %A Bertrand, Nicolas %A Brouji, H. El %A Delétage, Jean-Yves %A Woirgard, Eric %D 2010 %J Microelectronics Reliability %K dblp %N 9-11 %P 1796-1803 %T Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#BriatVBBDW10 %V 50

@article{journals/mr/BriatVBBDW10, added-at = {2015-02-05T00:00:00.000+0100}, author = {Briat, Olivier and Vinassa, Jean-Michel and Bertrand, Nicolas and Brouji, H. El and Delétage, Jean-Yves and Woirgard, Eric}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/259d30c5ac1f00f127910307bf213d3f5/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2010.07.118}, interhash = {db0e1c4d0cbadb9c59f093db8f30e2e0}, intrahash = {59d30c5ac1f00f127910307bf213d3f5}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1796-1803}, timestamp = {2016-02-02T02:02:06.000+0100}, title = {Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#BriatVBBDW10}, volume = 50, year = 2010 }