%0 Journal Article %1 journals/mr/WolfGSG05 %A Wolf, Heinrich %A Gieser, Horst A. %A Soldner, Wolfgang %A Gossner, Harald %D 2005 %J Microelectronics Reliability %K dblp %N 9-11 %P 1421-1424 %T A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#WolfGSG05 %V 45

@article{journals/mr/WolfGSG05, added-at = {2018-11-30T00:00:00.000+0100}, author = {Wolf, Heinrich and Gieser, Horst A. and Soldner, Wolfgang and Gossner, Harald}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d305f3f1bbce9cda89b76badab189227/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.07.032}, interhash = {da2b78d8dfd91f98ddc057f20b41c0b2}, intrahash = {d305f3f1bbce9cda89b76badab189227}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1421-1424}, timestamp = {2019-09-27T10:58:38.000+0200}, title = {A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#WolfGSG05}, volume = 45, year = 2005 }