%0 Journal Article %1 journals/tcad/XuRHFB15 %A Xu, Xiaolin %A Rahmati, Amir %A Holcomb, Daniel E. %A Fu, Kevin %A Burleson, Wayne P. %D 2015 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 6 %P 903-914 %T Reliable Physical Unclonable Functions Using Data Retention Voltage of SRAM Cells. %U http://dblp.uni-trier.de/db/journals/tcad/tcad34.html#XuRHFB15 %V 34

@article{journals/tcad/XuRHFB15, added-at = {2015-05-27T00:00:00.000+0200}, author = {Xu, Xiaolin and Rahmati, Amir and Holcomb, Daniel E. and Fu, Kevin and Burleson, Wayne P.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e97363342737cb7b137ea6b93eccde95/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2015.2418288}, interhash = {d3aa06dfa554f408dd7c32ffa54487b5}, intrahash = {e97363342737cb7b137ea6b93eccde95}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 6, pages = {903-914}, timestamp = {2016-02-02T10:07:36.000+0100}, title = {Reliable Physical Unclonable Functions Using Data Retention Voltage of SRAM Cells.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad34.html#XuRHFB15}, volume = 34, year = 2015 }