%0 Journal Article %1 journals/mr/BlascoNA02 %A Blasco, X. %A Nafría, Montserrat %A Aymerich, Xavier %D 2002 %J Microelectronics Reliability %K dblp %N 9-11 %P 1513-1516 %T Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO2 Gate Oxide on MOS Structures. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#BlascoNA02 %V 42

@article{journals/mr/BlascoNA02, added-at = {2015-02-05T00:00:00.000+0100}, author = {Blasco, X. and Nafría, Montserrat and Aymerich, Xavier}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/282379366b08135abf8938e5bc9ef51b9/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(02)00181-6}, interhash = {d33d6b5d17ed2d7f5373f1f4368656c4}, intrahash = {82379366b08135abf8938e5bc9ef51b9}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1513-1516}, timestamp = {2016-02-02T02:01:15.000+0100}, title = {Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO2 Gate Oxide on MOS Structures.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#BlascoNA02}, volume = 42, year = 2002 }