%0 Journal Article %1 journals/tcad/LiuO07 %A Liu, Fang %A Ozev, Sule %D 2007 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 8 %P 1465-1477 %T Statistical Test Development for Analog Circuits Under High Process Variations. %U http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#LiuO07 %V 26

@article{journals/tcad/LiuO07, added-at = {2008-04-08T00:00:00.000+0200}, author = {Liu, Fang and Ozev, Sule}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22ac2cf63bae05a6ea7550bde9beb5cf5/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2007.891373}, interhash = {d235caea0e15261312a0336f901e7fba}, intrahash = {2ac2cf63bae05a6ea7550bde9beb5cf5}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 8, pages = {1465-1477}, timestamp = {2016-02-02T10:07:33.000+0100}, title = {Statistical Test Development for Analog Circuits Under High Process Variations.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#LiuO07}, volume = 26, year = 2007 }