%0 Journal Article %1 journals/mr/FanVH10 %A Fan, X. J. %A Varia, B. %A Han, Q. %D 2010 %J Microelectronics Reliability %K dblp %N 4 %P 536-546 %T Design and optimization of thermo-mechanical reliability in wafer level packaging. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#FanVH10 %V 50

@article{journals/mr/FanVH10, added-at = {2010-09-29T00:00:00.000+0200}, author = {Fan, X. J. and Varia, B. and Han, Q.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25723e73ffa9ee0014595d2a1364430ec/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2009.11.010}, interhash = {d2148247e392bbc29644284bc411e550}, intrahash = {5723e73ffa9ee0014595d2a1364430ec}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 4, pages = {536-546}, timestamp = {2016-02-02T01:59:40.000+0100}, title = {Design and optimization of thermo-mechanical reliability in wafer level packaging.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#FanVH10}, volume = 50, year = 2010 }