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%0 Conference Paper
%1 conf/irps/HuangMKYSWBK19
%A Huang, H.
%A McLaughin, P. S.
%A Kelly, J. J.
%A Yang, C.-C.
%A Southwick, R. G.
%A Wang, M.
%A Bonilla, G.
%A Karve, G.
%B IRPS
%D 2019
%I IEEE
%K dblp
%P 1-5
%T Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch.
%U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#HuangMKYSWBK19
%@ 978-1-5386-9504-3
@inproceedings{conf/irps/HuangMKYSWBK19,
added-at = {2019-05-31T00:00:00.000+0200},
author = {Huang, H. and McLaughin, P. S. and Kelly, J. J. and Yang, C.-C. and Southwick, R. G. and Wang, M. and Bonilla, G. and Karve, G.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fbceedaae0602867cea05fa086682d76/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2019},
ee = {https://doi.org/10.1109/IRPS.2019.8720528},
interhash = {1d1a1055d08025ab1e229979d613d1fa},
intrahash = {fbceedaae0602867cea05fa086682d76},
isbn = {978-1-5386-9504-3},
keywords = {dblp},
pages = {1-5},
publisher = {IEEE},
timestamp = {2019-09-27T13:33:20.000+0200},
title = {Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#HuangMKYSWBK19},
year = 2019
}