%0 Conference Paper %1 conf/date/YeA0LP19 %A Ye, Wei %A Alawieh, Mohamed Baker %A Li, Meng %A Lin, Yibo %A Pan, David Z. %B DATE %D 2019 %E Teich, Jürgen %E Fummi, Franco %I IEEE %K dblp %P 54-59 %T Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection. %U http://dblp.uni-trier.de/db/conf/date/date2019.html#YeA0LP19 %@ 978-3-9819263-2-3

@inproceedings{conf/date/YeA0LP19, added-at = {2019-05-20T00:00:00.000+0200}, author = {Ye, Wei and Alawieh, Mohamed Baker and Li, Meng and Lin, Yibo and Pan, David Z.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/208e21ce9f8a375156ec486b6520ca263/dblp}, booktitle = {DATE}, crossref = {conf/date/2019}, editor = {Teich, Jürgen and Fummi, Franco}, ee = {https://doi.org/10.23919/DATE.2019.8714960}, interhash = {d1968b58078701267bbcf07a3f80d661}, intrahash = {08e21ce9f8a375156ec486b6520ca263}, isbn = {978-3-9819263-2-3}, keywords = {dblp}, pages = {54-59}, publisher = {IEEE}, timestamp = {2019-09-27T13:35:37.000+0200}, title = {Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection.}, url = {http://dblp.uni-trier.de/db/conf/date/date2019.html#YeA0LP19}, year = 2019 }