%0 Journal Article %1 journals/mr/BrunnerBKSWW03 %A Brunner, Frank %A Braun, A. %A Kurpas, Paul %A Schneider, J. %A Würfl, Joachim %A Weyers, Markus %D 2003 %J Microelectronics Reliability %K dblp %N 6 %P 839-844 %T Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#BrunnerBKSWW03 %V 43

@article{journals/mr/BrunnerBKSWW03, added-at = {2010-09-29T00:00:00.000+0200}, author = {Brunner, Frank and Braun, A. and Kurpas, Paul and Schneider, J. and Würfl, Joachim and Weyers, Markus}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2cb95c8e126767ab5ffaea61ed506066b/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(03)00068-4}, interhash = {d0e9fb069813e3fbb44cf59cb6e342ad}, intrahash = {cb95c8e126767ab5ffaea61ed506066b}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 6, pages = {839-844}, timestamp = {2016-02-02T02:01:00.000+0100}, title = {Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#BrunnerBKSWW03}, volume = 43, year = 2003 }