%0 Conference Paper %1 conf/ats/ZhongKARC11 %A Zhong, Shida %A Khursheed, S. Saqib %A Al-Hashimi, Bashir M. %A Reddy, Sudhakar M. %A Chakrabarty, Krishnendu %B Asian Test Symposium %D 2011 %I IEEE Computer Society %K dblp %P 389-394 %T Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. %U http://dblp.uni-trier.de/db/conf/ats/ats2011.html#ZhongKARC11 %@ 978-1-4577-1984-4

@inproceedings{conf/ats/ZhongKARC11, added-at = {2016-01-13T00:00:00.000+0100}, author = {Zhong, Shida and Khursheed, S. Saqib and Al-Hashimi, Bashir M. and Reddy, Sudhakar M. and Chakrabarty, Krishnendu}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24de7025b44e37a4ae8a4e7ad8be4b476/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2011}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.16}, interhash = {cedd9353855e2e428dde3ba2328b87e2}, intrahash = {4de7025b44e37a4ae8a4e7ad8be4b476}, isbn = {978-1-4577-1984-4}, keywords = {dblp}, pages = {389-394}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T14:23:14.000+0100}, title = {Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2011.html#ZhongKARC11}, year = 2011 }