%0 Journal Article %1 journals/mr/HayamaTOMSCRK04 %A Hayama, Kiyoteru %A Takakura, Kenichiro %A Ohyama, Hidenori %A Mercha, Abdelkarim %A Simoen, Eddy %A Claeys, Cor %A Rafí, Joan Marc %A Kokkoris, Michael %D 2004 %J Microelectronics Reliability %K dblp %N 9-11 %P 1721-1726 %T Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#HayamaTOMSCRK04 %V 44

@article{journals/mr/HayamaTOMSCRK04, added-at = {2015-02-05T00:00:00.000+0100}, author = {Hayama, Kiyoteru and Takakura, Kenichiro and Ohyama, Hidenori and Mercha, Abdelkarim and Simoen, Eddy and Claeys, Cor and Rafí, Joan Marc and Kokkoris, Michael}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26f911fd8f6f329b0f3c9993cd32a22e3/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2004.07.063}, interhash = {cccf9e44ff10130b4b32d1cf688c49ce}, intrahash = {6f911fd8f6f329b0f3c9993cd32a22e3}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1721-1726}, timestamp = {2016-02-02T02:00:17.000+0100}, title = {Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#HayamaTOMSCRK04}, volume = 44, year = 2004 }