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%0 Conference Paper
%1 conf/irps/TangCJBTWWM15
%A Tang, Baojun
%A Croes, Kris
%A Jourdan, Nicolas
%A Bömmels, Jürgen
%A Tokei, Zsolt
%A Wolf, Ingrid De
%A Wilcox, Eric
%A McMullen, Timothy
%B IRPS
%D 2015
%I IEEE
%K dblp
%P 2
%T Constant voltage electromigration for advanced BEOL copper interconnects.
%U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TangCJBTWWM15
%@ 978-1-4673-7362-3
@inproceedings{conf/irps/TangCJBTWWM15,
added-at = {2016-03-07T00:00:00.000+0100},
author = {Tang, Baojun and Croes, Kris and Jourdan, Nicolas and Bömmels, Jürgen and Tokei, Zsolt and Wolf, Ingrid De and Wilcox, Eric and McMullen, Timothy},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b62da8cd819df23f174d51f86097450d/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2015},
ee = {http://dx.doi.org/10.1109/IRPS.2015.7112685},
interhash = {cbd06ce6b520f204c73aa1fc9ce94f0a},
intrahash = {b62da8cd819df23f174d51f86097450d},
isbn = {978-1-4673-7362-3},
keywords = {dblp},
pages = 2,
publisher = {IEEE},
timestamp = {2016-03-08T10:33:19.000+0100},
title = {Constant voltage electromigration for advanced BEOL copper interconnects.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TangCJBTWWM15},
year = 2015
}