%0 Journal Article %1 journals/tvlsi/BashirCMKL14 %A Bashir, Muhammad Muqarrab %A Chen, Chang-Chih %A Milor, Linda %A Kim, Dae Hyun %A Lim, Sung Kyu %D 2014 %J IEEE Trans. VLSI Syst. %K dblp %N 8 %P 1750-1762 %T Backend Dielectric Reliability Full Chip Simulator. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#BashirCMKL14 %V 22

@article{journals/tvlsi/BashirCMKL14, added-at = {2014-07-29T00:00:00.000+0200}, author = {Bashir, Muhammad Muqarrab and Chen, Chang-Chih and Milor, Linda and Kim, Dae Hyun and Lim, Sung Kyu}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/209bce4c69562a52e29f8819d9ba4b79d/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2013.2277856}, interhash = {cb4e02f5e15aa47cdb60e6b9c4f915a8}, intrahash = {09bce4c69562a52e29f8819d9ba4b79d}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 8, pages = {1750-1762}, timestamp = {2016-02-02T02:12:28.000+0100}, title = {Backend Dielectric Reliability Full Chip Simulator.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#BashirCMKL14}, volume = 22, year = 2014 }